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High Low Rapid Change Alternative Temperature Cycling Chamber For Accelerated Stress Test

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High Low Rapid Change Alternative Temperature Cycling Chamber For Accelerated Stress Test

China High Low Rapid Change Alternative Temperature Cycling Chamber For Accelerated Stress Test supplier
High Low Rapid Change Alternative Temperature Cycling Chamber For Accelerated Stress Test supplier High Low Rapid Change Alternative Temperature Cycling Chamber For Accelerated Stress Test supplier High Low Rapid Change Alternative Temperature Cycling Chamber For Accelerated Stress Test supplier High Low Rapid Change Alternative Temperature Cycling Chamber For Accelerated Stress Test supplier

Large Image :  High Low Rapid Change Alternative Temperature Cycling Chamber For Accelerated Stress Test

Product Details:

Place of Origin: Dongguan/China
Brand Name: Q1-Test
Certification: CE
Model Number: QTH-416KC

Payment & Shipping Terms:

Minimum Order Quantity: 1 Set
Price: Negotiable
Packaging Details: Plywood Box
Delivery Time: 20 Working Days
Payment Terms: T/T
Supply Ability: 20 Sets per Month
Detailed Product Description
Temperature: Range -40℃ ~ +150℃ Dimension: Internal 416L, 70 X 85 X 70cm
Heating Rate: 5℃ ~ 20℃/min (Optional) Insulation Material: Rigid Polyurethane Foam
Temp Cycling: Linearity Or Average Interior Material: Stainless Steel SUS#304
High Light:

thermal cycling chamber

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thermal cycling test equipment

 

High Low Rapid Change Temperature Cycling Climatic Chamber for Accelerated Stress Test

 

Product Overview:

Rapid change temperature testing specifies a test sample temperature variation rate of 15°C/minute or less, which is the biggest difference between this method and thermal shock testing. Since rapid change temperature testing achieves highly repeatable test results, it is used for compliance testing for standards such as JEDEC (JESD 22-A104B).

 

With the ongoing rise in issues affecting the reliability of electronic devices and circuit boards, a better-suited evaluation testing method is needed to respond to issues such as higher device operation temperatures resulting from greater semiconductor integration, changes in device mounting methods such as BGA and CSP, and the use of lead-free solder.

 

Rapid change temperature testing is a type of thermal cycling tests developed to improve the failure repeatability of thermal shock tests.

 

CHOOSING CHAMBER SIZE

Choosing the size of your chamber is based on 3 critical factors

Application test requirements

Load size and density

Test room conditions

 

Chambers are used in a wide variety of applications and come in many sizes. The most common volumes produced by chamber manufacturers range in size from small units of 0.5 to 64 cubic feet (14 to 1,812 liters) to walk-in rooms averaging 1,123 cubic feet (31,789 liters), or even drive-in units that fit as many as six cars.

 

Features:

1, Available internal chamber volumes: 150L, 225L, 416L, 800L and 1000L;

2, To preset different heating and cooling rate: 5℃/min, 10℃/min, 15℃/min;

3, Support rapid change temperature test, condensation test, high temperature/humidity test, temperature/humidity loop test, etc.

4, Complete real time curve display;

5, Conform but not limited standards: MIL-STD-2164, MIL-344A-4-16, GJB-1032-90, GJB/Z34-5.1.6, etc.

 

High Low Rapid Change Alternative Temperature Cycling Chamber For Accelerated Stress Test

 

Technical Specifications:

Model Temp Range Internal Dimension(mm) Exterior Dimension (mm)
QTH-150KB -20℃~﹢150℃ 500 x 600 x 500 800 x 1450 x 1120
QTH-225KB 500 x 750 x 600 800 x 1620 x 1320
QTH-416KB 700 x 850 x 700 980 x 1860 x 1600
QTH-800KB 1000 x 1000 x 800 1350 x 1980 x 1700
QTH-1000KB 1000 x 1000 x 1000 1350 x 1980 x 1800
QTH-150KC -40℃~﹢150℃ 500 x 600 x 500 800 x 1450 x 1120
QTH-225KC 500 x 750 x 600 800 x 1620 x 1320
QTH-416KC 700 x 850 x 700 980 x 1860 x 1600
QTH-800KC 1000 x 1000 x 800 1350 x 1980 x 1700
QTH-1000KC 1000 x 1000 x 1000 1350 x 1980 x 1800
QTH-150KD -70℃~﹢150℃ 500 x 600 x 500 800 x 1450 x 1120
QTH-225KD 500 x 750 x 600 800 x 1620 x 1320
QTH-416KD 700 x 850 x 700 980 x 1860 x 1600
QTH-800KD 1000 x 1000 x 800 1350 x 1980 x 1700
QTH-1000KD 1000 x 1000 x 1000 1350 x 1980 x 1800
Temperature fluctuation ±0.5℃
Temperature uniformity ±2.0℃
Heating/Cooling Rate 3℃/min, 5℃/min, 10℃/min, 15℃/min, 20℃/min (optional)
Temperature slope Linearity or Average
Control system Large LCD touch screen controller, data can be displayed directly
Inner materials SUS#304 Stainless steel
Outer materials Cold rolled steel sheet powder baking paint
Insulation material Rigid polyurethane foam
Cooling mode

1, Cooling system (No consumables, suitable for long-term high frequency test)

2, Liquid nitrogen assist in cooling (Liquid nitrogen is a material used for short and low frequency test)

Safety devices Electric leakage protection , Short circuit protection, Overheat protection ,Water shortage protection , Dry burn protection switch alarm device
Power Supply AC220/380V, 50/60HZ,
Note 1, The performance values are no specimen inside the test area.
2, At 20ºC ambient temperature, relative humidity 65%RH, rated voltage

 

High Low Rapid Change Alternative Temperature Cycling Chamber For Accelerated Stress Test

 

Contact Details
DongGuan Q1-Test Equipment Co., Ltd.

Contact Person: Mr. Andy DAI

Tel: +86-13450058229

Fax: 86-769-2278-4276

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