Product Details:
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Magnification: | Standard 100X | DIC: | DIC Slider Matching 5X/10X/20X Objective |
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Stage: | Stage Size: 180 X 145mm | Eyepiece: | Wide-Field Plan Eyepiece 10X |
Optical: | Infinity Optics System | Focus System: | Available Distance 133mm |
Highlight: | stereo inspection microscope,stereo dissecting microscope |
Infinity Optic System Digital Metallurgical Microscope with DIC and LED Illumination
Technical Data:
Main parameters | Total magnification | 100X (standard configure) | ||||
Mechanical tube length | ∞ | |||||
Conjugate distance of objective | ∞ | |||||
Eyepiece | Wide-field plan eyepiece | WF 10X | field of view number Ф22mm |
Eyepiece interface Ф30mm |
Parfocal distance 10mm |
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Trinocular | Observation angle of 30° with photography port,spectro rate 8:2(eyepiece:photography) | |||||
Strain-free plan achromatic objective | Magnification | Numerical aperture | Working distance (mm) | Thickness of cover glass (mm) | Remarks | |
10X | 0.25 | 20.2 | - | |||
Analyzer | Insert type, can be switch freely, the direction of polarization has preset, no use for adjust | |||||
Polarizer | Insert type, can be switch freely, 360°rotatable | |||||
DIC Slider | DIC slider matching 5X/10X/20X objective,horizontal adjustable | |||||
X-Y Stage | double layer mechanism stage, size: 180 X 145mm, moving range: 35X 30 mm(X-Y) | |||||
Vertical availability distance | Focus system available distance 133mm, observational specimen maximal thickness up to 130mm. | |||||
focus system | Coaxial coarse/fine focus system, minimum division of fine focusing: 2μm | |||||
Illumination | Coaxial illumination using high brightness white LED. Brightness adjustable | |||||
Main power sullpy | AC:85V~265V 50/60Hz,fuse specification: 250V 3.0A | |||||
Accessory (optional) | Objective | 20X strain-free plan achromatic objective, NA: 0.40, working distance: 8.0mm | ||||
Digital camera | 130, 300, 500, 1000mega pixels, with image analysis software. |
What is Differential interference contrast (DIC)?
Differential interference contrast (DIC) microscopy, also known as Nomarski interference contrast (NIC) or Nomarski microscopy, is an optical microscopy technique used to enhance the contrast in unstained, transparent samples.
DIC works on the principle of interferometry to gain information about the optical path length of the sample, to see otherwise invisible features.
A relatively complex optical system produces an image with the object appearing black to white on a grey background. This image is similar to that obtained by phase contrast microscopy but without the bright diffraction halo. The technique was developed by Polish physicist Georges Nomarski in 1952.
Features:
iMet-230MDIC Reflected light differential interface contrast microscope is a high capability price rate inspecting optical instrument.
iMet-230MDIC adopts excellent infinity optics system, built-in high brightness LED illumination, it is provided with differential interface contrast observation function.
Trinocular/photography optical body, reflects the ture reduction of visual observe, digital photography and microscopy technology integration, the observed interface image has a stronger sense of 3D.
iMet-230MDIC is suitable for the microscopic morphology observation of non-transparent material surface, such as microscopic morphology of LCD conductive particles, it is the ideal instruments in quality inspection, structural analysis of precision manufacturing.
Metallurgical microscopes provide polarization which makes it much easier to view a variety of minerals, types of metals and even ink samples. Material defect analysis is performed with a metallurgical microscope in search of the causes of corrosion, fatigue, stress fractures and cracks. Environmental protection and oil production often use metallurgical microscopes and in particular they may utilize both the high magnification and polarization features of the metallurgical microscopes.
Contact Person: Mr. Andy DAI
Tel: +86-13450058229
Fax: 86-769-2278-4276